Imaging surfaces with atoms
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Scanning helium microscopy is a novel form of microscopy which uses neutral low energy (less than 100meV) helium atoms to image the surface of a material or structure. The low beam energy leads to a technique which is exclusively surface sensitive and opens the possibility of studying materials that would be damaged by microscopies that use a higher beam energy. In this talk I will discuss the progress being made in developing an atom microscope, including the in-house production of a high sensitivity mass spectrometer and observed contrast mechanisms.
This talk is part of the Physics and Chemistry of Solids Group series.
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