Spectrum Imaging: Challenges with Real Materials

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• Professor Alan J Craven, Department of Physics and Astronomy, University of Glasgow
• Tuesday 13 June 2006, 11:30-12:30
• T001 [Tower Seminar Room], Materials Science and Metallurgy, Department of.

If you have a question about this talk, please contact Edmund Ward.

There are many modern materials and devices where an understanding of the structure, composition and chemistry on the atomic scale is crucial to achieving the performance sought from them. The modern nanoanalytical electron microscope can record a range of analytical data (e.g. electron and x-ray spectra) at each pixel in an image with a spatial resolution approaching atomic size in a normal microscope and better than atomic size in an aberration corrected microscope. Thus we have the ability to provide a great deal but not all the information sought. Challenges are presented when the are a wide range of atomic numbers present or when one element is present in a low concentration. Benefits come from the chemical information present in the fine structure on ionisation edges. A range of examples ranging from semiconductors to steels will be used to illustrate what is possible.

This talk is part of the Electron Microscopy Group Seminars series.

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