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University of Cambridge > Talks.cam > Physics and Chemistry of Solids Group > The formation of contrast in scanning helium microscopy
The formation of contrast in scanning helium microscopyAdd to your list(s) Download to your calendar using vCal
If you have a question about this talk, please contact Stephen Walley. Over the last decade a new microscopy technique has emerged that uses neutral helium atoms as the probe particles. It has been termed scanning helium microscopy (SHeM), also known as neutral atom microscopy (NAM). SHeM produces helium atom micrographs by scanning the sample beneath a focused or collimated helium microprobe. As the technique is maturing, research efforts are moving on from the development of proof of concept instruments to the exploring of applications and optimising designs for the second generation of machine. In particular the mechanisms of contrast formation in SHeM are an active area of investigation. Join on your computer, mobile app or room device Click here to join the talk online Meeting ID: 397 072 953 845 Passcode: 4FY5i8 This talk is part of the Physics and Chemistry of Solids Group series. This talk is included in these lists:
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