University of Cambridge > > Semiconductor Physics Group Seminars > (SP Wednesday Workshop) - Probe for Cryostat with RF Input and Optical Scanning Function

(SP Wednesday Workshop) - Probe for Cryostat with RF Input and Optical Scanning Function

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If you have a question about this talk, please contact Teri Bartlett.

Recently, intensive research of single photon source is driven by the applications in quantum information sciences. A single photon source based on flying electrons carried by surface acoustic wave (SAW) is proposed. Single photon is emitted as an electron surfs with the SAW , crosses a n-p junction and recombines with a hole. In order to generate the SAW , search and detect the emission of single photons, a probe with RF input and optical scanning ability is essential. The first part of my talk focuses on how we design and build this probe. In the second part, I will discuss the test of the optical scanning system, which consists of a fibre, a lens assembly, and a piezo-driven 3-axes stepper. A chip is mounted on the probe and is imaged using the optical scanning system to check the performance of the system. The lens assembly is first moved in z direction to reach the focal point. A 2D scan is then carried out to find the features on the chip. The features such as optical gates, E-beam gates and mesa edge are used to calibrate the asymmetric piezo movement and calculate the length per step. A clear image of the chip can be obtained with proper focusing and asymmetry calibration. In addition, it is shown that the optical scanning system can image a sub-micron scale 1D channel. After this test, the probe will soon be ready for measurement of single photon source devices.

This talk is part of the Semiconductor Physics Group Seminars series.

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