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Advanced Electron Microscopy for Nanomaterials

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If you have a question about this talk, please contact Dr Jonathan Barnard.

Nanomaterials pose ever-increasing challenges for characterization with their small dimensions, three-dimensional shapes, demanding internal structures, and novel electronic properties. The field of electron microscopy has enjoyed many outstanding advances which allow for the detailed understanding of complex nanomaterials, such as aberration-correction, monochromation for EELS , three-dimensional imaging for inorganic materials, in-situ microscopy, and atom-probe tomography. In this talk I will review our recent results using a combination of some of these techniques to solve materials problems for a variety of nanomaterials with applications ranging from optoelectronics to energy storage.

This talk is part of the Electron Microscopy Group Seminars series.

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