Analysing interfaces in multilayer films using STEM-EELS

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• David McComb, Imerial College London
• Tuesday 26 February 2008, 15:00-16:00
• T001 [Tower Seminar Room], Materials Science and Metallurgy, Department of.

If you have a question about this talk, please contact Dr Jonathan Barnard.

In this presentation I will introduce the technique of scanning transmission electron microscopy electron energy loss spectroscopy (STEM-EELS) for analysis of multilayer thin films. Using examples of high-k dielectric stacks and ferroelectric superlattices I will show that STEM -EELS enables us to probe the chemistry, structure and bonding with high spatial resolution.

This talk is part of the Electron Microscopy Group Seminars series.

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