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Electron diffractive imaging of extended objects

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The generally higher spatial frequency information contained in electron diffraction patterns implies that so-called diffractive imaging (diffraction-based phase retrieval) has the potential to offer structural information at higher resolution than axial phase contrast imaging. Despite this, to date there are exceedingly few articles reporting electron diffractive imaging experiments, and these have been restricted to localized objects, e.g. nanotubes and nanoparticles. In this talk I will discuss some of the limitations and difficulties associated with this seemingly simple method of imaging, and our current efforts to overcome them in order to make the method amenable to extended objects.

This talk is part of the Electron Microscopy Group Seminars series.

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