Optimizing spatial resolution and minimizing beam damage in TEM and EELS

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• Ray F. Egerton, Physics Department, University of Alberta, Canada
• Monday 15 August 2016, 11:30-12:30
• Goldsmiths 1, Lecture room, Dept. of Materials Science and Metallurgy.

If you have a question about this talk, please contact Duncan Johnstone.

This talk will address 4 factors that determine the spatial resolution of imaging or spectroscopy in the TEM , with particular attention to beam-induced damage and the delocalization of inelastic scattering. In particular, recent advances in monochromator design have made possible the spectroscopy of energy losses below 1 eV. In this regime delocalization severely limits the spatial resolution but provides some relief from radiation damage.

This talk is part of the Electron Microscopy Group Seminars series.

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