Making the invisible visible: The nm scale perspective

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• Dr. Annie Loo, Carl Zeiss Microscopy Ltd., Cambridge
• Thursday 23 April 2015, 18:30-20:00
• Lecture Theatre 0, University of Cambridge Engineering Department, Trumpington Street, Cambridge.

If you have a question about this talk, please contact Tim Wilkinson.

Tea is served from 6pm

The scanning electron microscope (SEM) has been in use in various applications including aircraft engine failure analysis, medical, mining, electron beam nanolithography and semiconductor integrated circuit inspection. This presentation outlines the operation of the scanning electron microscope, innovations to date that enhance the capability of SEM in the various applications mentioned above, example of organisations that use SEM in their production process or R&D and the results that contributed to our daily lives.

This talk is part of the IET Cambridge Network - Lectures series.

This talk is included in these lists:

• All Talks (aka the CURE list)
• CamBridgeSens
• Cambridge talks
• IET Cambridge Network - Lectures
• Institution of Mechanical Engineers (Cambridgeshire Area)
• Lecture Theatre 0, University of Cambridge Engineering Department, Trumpington Street, Cambridge
• Life Science Interface Seminars
• School of Technology
• Trust & Technology Initiative - interesting events

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