University of Cambridge > > IET Cambridge Network - Lectures > Boundary Scan. From Connection Testing to On-silicon Toolkits

Boundary Scan. From Connection Testing to On-silicon Toolkits

Add to your list(s) Download to your calendar using vCal

If you have a question about this talk, please contact Ian Stevens.

ALL WELCOME - FREE EVENT - IET Knowledge Networks Lecture

Boundary scan based on the JTAG 1149 .1 IEEE standard has been around a long time – so have test engineers. Following the usual pressures to shrink, further integrate and ‘make re-programmable’ new designs; we are now seeing a renewed interest in test using JTAG .

XJTAG , Matt Lee’s company, has added a suite of test tools on top of the 1149.1 standard. These are based around a high-level language, XJEASE . It is this ‘language’ which has proved invaluable for reasons you probably will not guess. This talk will explain how JTAG Boundary Scan works and you’ll see some examples of it in action from its basic use to advanced on-silicon diagnosis.

This talk is part of the IET Cambridge Network - Lectures series.

Tell a friend about this talk:

This talk is included in these lists:

Note that ex-directory lists are not shown.


© 2006-2023, University of Cambridge. Contact Us | Help and Documentation | Privacy and Publicity