Imaging Bulk Heterostructure Blends, Carrier Dynamics and Fluctuations in Bulk Heterostructure Blends and Ferroelectric Polymer Transistors.
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Near field scanning optical microscopy (NSOM) along with local photocurrent mapping is a unique technique that provides direct insight into evolution of optoelectronic properties in polymer blends with morphological (2D and 3D) variations.We demonstrate the utility of this method in Si-PCPDTBT/ PC71BM model devices. A steady state photocurrrent response is a net outcome of the various charge generation, transport and loss processes. We study the accompanying fluctuations in the photocurrent which represents the discernible signature of the deviation from a time-independent steady current and attribute it to trapping events. The trapping process involves a capture, waiting and release stages of finite duration with a resulting noise spectrum which can takes a l/f type response in a relevant frequency regime.
This talk is part of the Optoelectronics Group series.
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