Imaging Bulk Heterostructure Blends, Carrier Dynamics and Fluctuations in Bulk Heterostructure Blends and Ferroelectric Polymer Transistors.

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• K. S. Narayan - Jawaharlal Nehru Centre for Advanced Scientific Research Bangalore India
• Tuesday 28 June 2011, 14:30-15:30
• Kapitza Building Seminar Room, Cavendish Laboratory, Department of Physics.

If you have a question about this talk, please contact Jenny Clark.

Near field scanning optical microscopy (NSOM) along with local photocurrent mapping is a unique technique that provides direct insight into evolution of optoelectronic properties in polymer blends with morphological (2D and 3D) variations.We demonstrate the utility of this method in Si-PCPDTBT/ PC71BM model devices. A steady state photocurrrent response is a net outcome of the various charge generation, transport and loss processes. We study the accompanying fluctuations in the photocurrent which represents the discernible signature of the deviation from a time-independent steady current and attribute it to trapping events. The trapping process involves a capture, waiting and release stages of finite duration with a resulting noise spectrum which can takes a l/f type response in a relevant frequency regime.

This talk is part of the Optoelectronics Group series.

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