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X-ray scattering studies on F8T2 polymer thin films and self assembled monolayers

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Advanced x-ray scattering methods like x-ray reflectivity and grazing incidence diffraction are used to characterise thin films of the polymer poly[(9,9-dioctylfluorene)co(bithiophene)] (F8T2) and of quinquethiophene based self assembled monolayers (SAMs). The weak structural order in F8T2 polymer films can be drastically increased by preparing films on rubbed polyimide surfaces combined with a defined heat treatment. The formation of liquid crystalline and crystalline thin films is observed in-situ by temperature dependent x-ray diffraction. The formation of SAMs on silicon oxide surfaces is studied ex-situ as a function of coverage. Sub-monolayers and fully closed monolayers are investigated in terms of their morphology and crystallographic properties. It is found that two-dimensional crystals are formed which are induced by the quinquethiophene units of the SAM molecule.

This talk is part of the Optoelectronics Group series.

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