University of Cambridge > Talks.cam > Electron Microscopy Group Seminars > The development of advanced TEM techniques for the characterisation of Pt catalyst nanoparticles

The development of advanced TEM techniques for the characterisation of Pt catalyst nanoparticles

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Industrial catalysts usually comprise crystalline particles of high atomic number that have sizes of between 1 and 20 nm and are supported or embedded in a lower atomic number matrix. Electron microscopy is an important tool for the physical characterisation of their shapes, sizes and crystalline structures, which are, in turn, important for understanding their catalytic properties. Here, developments in transmission electron microscopy (such as spherical aberration correctors) and in scanning transmission electron microscopy (such as high-angle annular dark field electron tomography) are applied to the study of 5-15 nm platinum nanoparticles supported on carbon. Indirect methods are also used to remove lens aberrations using through-focal series exit-wavefunction restoration.

This talk is part of the Electron Microscopy Group Seminars series.

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