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Advancing Microstructural Characterization with EBSD and TKD – new algorithms, more dimensions, and new detectors

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Electron backscatter diffraction (EBSD) is a powerful technique that enables us to probe the structure of crystalline materials within the scanning electron microscope (SEM). Transmission Kikuchi diffraction (TKD) adapts this technique to look at thin lamella in the SEM and improves the spatial resolution significantly. In this talk, I will introduce some correlative approaches to improve our use of EBSD to analyse precipitates in Ni-based superalloys and guide alloy-design using machine learning algorithms & pattern matching, as well as correlative approaches with simultaneous energy dispersive X-ray spectroscopy (EDS/EDX). To advance these techniques even further, I will discuss recent work capturing TKD and EBSD patterns with direct electron detectors (DEDs) based upon the Timepix architectures. Finally, I will introduce some 3D plasma focussed ion beam (pFIB) EBSD tomography of deformation under indents in magnesium, which we are using to understand anisotropic plastic deformation mechanisms in lightweight alloys.

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