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SUMMARY:Randomised testing of a microprocessor model using SMT-solver stat
 e generation - Dr Brian Campbell\, Edinburgh
DTSTART:20140916T100000Z
DTEND:20140916T110000Z
UID:TALK54336@talks.cam.ac.uk
CONTACT:Prof Simon Moore
DESCRIPTION:Brian will present details of their test generation techniques
  before we dive into specifics about how to use their techniques to test o
 ur CHERI processor.
LOCATION:SC04\, Computer Laboratory\, William Gates Building
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