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SUMMARY:Imaging Bulk Heterostructure Blends\, Carrier Dynamics and Fluctua
 tions in Bulk Heterostructure Blends and Ferroelectric Polymer Transistors
 . - K. S. Narayan - Jawaharlal Nehru Centre for Advanced Scientific Resear
 ch Bangalore India
DTSTART:20110715T133000Z
DTEND:20110715T143000Z
UID:TALK31996@talks.cam.ac.uk
CONTACT:Jenny Clark
DESCRIPTION:Near field scanning optical microscopy (NSOM) along with local
  photocurrent mapping is a unique technique that provides direct insight i
 nto evolution of optoelectronic properties in polymer blends with morpholo
 gical (2D and 3D) variations.We demonstrate the utility of this method in 
 Si-PCPDTBT/ PC71BM model devices. A steady state photocurrrent response  i
 s a net outcome of the various charge generation\, transport and loss proc
 esses. We study the accompanying fluctuations in the photocurrent which re
 presents the discernible signature of  the deviation from a time-independe
 nt steady current and attribute it to trapping events. The trapping proces
 s involves a capture\, waiting and release stages of finite duration with 
 a resulting noise spectrum which can takes a l/f type response in  a relev
 ant frequency regime. 
LOCATION:Kapitza Building Seminar Room\, Cavendish Laboratory\, Department
  of Physics
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