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SUMMARY:X-ray scattering studies on F8T2 polymer thin films and self assem
 bled monolayers - Prof. Roland Resel\, T.U.Graz\, Austria
DTSTART:20090505T133000Z
DTEND:20090505T143000Z
UID:TALK18028@talks.cam.ac.uk
CONTACT:Chris McNeill
DESCRIPTION:Advanced x-ray scattering methods like x-ray reflectivity and 
 grazing incidence diffraction are used to characterise thin films of the p
 olymer poly[(9\,9-dioctylfluorene)-co-(bithiophene)]\n(F8T2) and of quinqu
 ethiophene based self assembled monolayers (SAMs). The weak structural ord
 er in F8T2 polymer films can be drastically increased by preparing films o
 n rubbed polyimide surfaces combined with a defined heat treatment. The fo
 rmation of liquid crystalline and crystalline thin films is observed in-si
 tu by temperature dependent x-ray diffraction. The formation of SAMs on si
 licon oxide surfaces is studied ex-situ as a function of coverage. Sub-mon
 olayers and fully closed monolayers are investigated in terms of their mor
 phology and crystallographic properties. It is found that two-dimensional 
 crystals are formed which are induced by the quinquethiophene units of the
  SAM molecule. \n
LOCATION:Kapitza Building Seminar Room\, Cavendish Laboratory\, Department
  of Physics
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