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SUMMARY:On Logical Masking Effects of Soft Errors - Prof. Sudhakar M. Redd
 y (University Of Iowa\, USA)
DTSTART:20081107T103000Z
DTEND:20081107T113000Z
UID:TALK14768@talks.cam.ac.uk
CONTACT:Dr George A Constantinides
DESCRIPTION:Soft errors caused by ionizing radiation are being noticed eve
 n in electronic devices operating at lower altitudes. Hardening of circuit
  components can be used to reduce or eliminate occurrence of errors at cir
 cuit outputs due to soft errors. Since hardening the complete circuit agai
 nst soft errors may result in unacceptable area and power consumption cost
 \, selectively hardening only a subset of the circuit nodes with the large
 st contribution to the soft error rate (SER) has been suggested. In this t
 alk we will first briefly review single event transients and their contrib
 utions to soft errors and masking of the effects of transients. Next we de
 scribe a scalable method to estimate the probability of logical masking. T
 he last part of the talk will present the results of an experiment to inve
 stigate the differences between undetectable permanent faults and transien
 t errors. \n\n\nBiography\n\nSudhakar M. Reddy received the undergraduate 
 degree in electronics and communication engineering from Osmania Universit
 y\, Hyderabad\, India\, M.E. degree from the Indian Institute of Science\,
  Bangalore\, India and the Ph.D. degree in electrical engineering from the
  University of Iowa\, Iowa City\, Iowa. Since 1968\, he has been a member 
 of the faculty of the Department of Electrical and Computer Engineering\, 
 University of Iowa\, where he is currently a University of Iowa Foundation
  Distinguished Professor. He served as the Chair of the Department from 19
 81 to 2000. \n\nDr. Reddy has published over four hundred papers in the ar
 eas of test and design for test of digital VLSI circuits\, coding theory a
 nd fault-tolerant computing. He is a Fellow of IEEE.  He received a Von Hu
 mboldt senior Research Fellowship in 1995 and a life time achievement awar
 d from VLSI Design Conference. Dr. Reddy has served twice as a guest edito
 r and as an associate editor of the IEEE Transactions on Computers and as 
 an associate editor of the IEEE Transactions on Computer-Aided Design of I
 ntegrated Circuits and Systems. He was the technical program chair of the 
 1989 International Fault-Tolerant Computing Symposium. \n
LOCATION:Room 611\, EEE
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