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SUMMARY:Full-field optical metrology - Jonathan Huntley\, Department of Me
 chanical\, Electrical and Manufacturing Engineering\, The University of Lo
 ughborough
DTSTART:20180531T150000Z
DTEND:20180531T160000Z
UID:TALK101260@talks.cam.ac.uk
CONTACT:Stephen Walley
DESCRIPTION:Rapid measurement of component dimensions is vital in many are
 as of high value manufacturing\, such as quality control and robotic machi
 ning. In this talk I will describe a full-field optical technique to measu
 re millions of coordinates in a few seconds\, and a numerical algorithm ba
 sed on the maximum likelihood method to recognise objects\, and estimate t
 heir pose\, within such ‘point clouds’. Applications include structura
 l testing\, reverse engineering\, and automated assembly with a robot. 
LOCATION:Mott Seminar Room\, Cavendish Laboratory
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