Advances in Label-Free High-Resolution Molecular Imaging using J Series III Cluster SIMS

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• Naoko Sano, Ionoptika. Ltd., Chandler’s Ford, UK
• Thursday 14 May 2026, 15:00-16:00
• Seminar Room West, Room A0.015, Ray Dolby Centre, Cavendish Laboratory.

If you have a question about this talk, please contact Malvina Constantinou.

J Series III Cluster SIMS represents the cutting edge of surface analysis, utilising Secondary Ion Mass Spectrometry (SIMS) with cluster beams as the primary ion beams to provide detailed chemical maps of materials from biological to semiconductors. The technique needs no matrix and probes a few nanometres from the top surface, especially using Ionoptika’s water Gas Cluster Ion Beam (GCIB), enabling sensitivity down to the ppb level for some cases. The J Series III Cluster SIMS with the unique “continuous” primary ion beams offers:

• High Sensitivity: from ppb to ppm levels.
• High spatial resolution: down to 300 nm beam spot size
• Matrix free
• 2D and 3D molecular imaging
• Cryogenic Capabilities

I will present the use of J Series III Cluster SIMS to investigate the 2D and 3D structure of a range of materials seen in Ionoptika’s lab including hybrid materials such as perovskite solar cells using the hard ionisation mode (small cluster ion beams) without preferential sputtering effects. I will also introduce novel future applications using Cluster SIMS such as measuring physical property (surface hardness).

This talk is part of the Physics and Chemistry of Solids Group series.

This talk is included in these lists:

• All Cavendish Laboratory Seminars
• All Talks (aka the CURE list)
• Centre for Health Leadership and Enterprise
• Featured lists
• ME Seminar
• Neurons, Fake News, DNA and your iPhone: The Mathematics of Information
• Physics and Chemistry of Solids Group
• School of Physical Sciences
• Seminar Room West, Room A0.015, Ray Dolby Centre, Cavendish Laboratory
• Thin Film Magnetic Talks

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