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Undersampling Raster Scans in Spectromicroscopy for reduced dose and faster measurements

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RNTW02 - Rich and non-linear tomography in medical imaging, materials and non destructive testing

X-ray spectromicroscopy is a powerful tool for studying material distributions, which is extracted from the data using a combination of PCA and cluster analysis. However, the traditional data collection setting has some significant weaknesses (e.g., long scanning times and material degradation due to x-ray radiation).In this talk, we present a novel approach for undersampling, reconstructing, and analysing X-ray spectromicroscopic measurements based on low-rank matrix completion. The new method allows the selection of robust sampling pattern, matrix rank and undersampling ratio, while minimising the impact of undersampling on the cluster analysis. Results obtained on real data will be illustrated.

This talk is part of the Isaac Newton Institute Seminar Series series.

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