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Radiation damage in metals and polymers

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Abstract With the widespread use of field-emission sources and aberration-corrected lenses, radiation damage in the TEM becomes a problem even for conducting specimens. We have performed experiments and calculations of electron-induced sputtering in order to better estimate the rate and incident-energy threshold of this form of damage. Previous EELS measurements of radiation damage in polymers suggested a remarkable reduction in damage in the case of small-diameter electron probes. I will show results that confirm these claims and discuss some possible interpretations.

This talk is part of the Electron Microscopy Group Seminars series.

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