University of Cambridge > > Electron Microscopy Group Seminars > From Source to Screen - Auditing the STEM to Improve Quantitative HAADF Precision

From Source to Screen - Auditing the STEM to Improve Quantitative HAADF Precision

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Aberration corrected HAADF STEM is capable of producing absolutely beautiful images. Unfortunately, pretty pictures alone are not enough to learn all there is to learn about our samples. For this we need so-called ‘quantitative HAADF ’. At its most simple this just involves dividing the observed intensity by the intensity of the full-beam, this then gives data expressed in units of ‘fractional beam current’ and is directly comparable with simulation. Unfortunately matters are not so simple, ADF detectors are far from homogeneous and post-specimen lenses can distort or truncate the scattering we aim to record. We have developed methods to evaluate the post-specimen flux and to incorporate the detector in-homogeneity to yield quantitative HAADF data with greatly improved accuracy. There are many applications of this improved imaging accuracy and 3D nanometrology of catalyst nanoparticles are presented as an example.

This talk is part of the Electron Microscopy Group Seminars series.

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